Srikrishna Nuvvula is passionate about improving patient safety in advanced cancer treatment, especially in the field of radiation therapy. His research focuses on post-market surveillance of charged-particle radiation therapy systems, using the FDA Manufacturer and User Facility Device Experience (MAUDE) database to study patient injuries, device malfunctions, and treatment-related complications. Through this work, Srikrishna examines how problems such as computer software failures, improper device use, and dose calculation errors can lead to incorrect radiation exposure, including radiation overdose, underdose, or unintended exposure. His interest lies at the intersection of medicine, healthcare technology, and medical device safety, with a focus on identifying preventable risks after devices are already in clinical use. By analyzing real-world complication reports, Srikrishna hopes to support improvements in radiation therapy systems, particularly software and safety refinements that can reduce avoidable harm for patients. His work reflects a commitment to using data-driven research to make medical technology safer, more reliable, and more effective in patient care.
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